发明名称 SEMICONDUCTOR APPARATUS AND PHYSICAL QUANTITY SENSING APPARATUS
摘要 In a semiconductor device, in particular a physical quantity sensing apparatus, the length and the width of the wiring connecting a sensor internal circuit and an output or power supply pad are adjusted so that the total parasitic resistance components R1 parasitic on the wiring and the sum Rf of the resistance values of resistors in the filter circuit for countermeasuring against electromagnetic noises satisfy the relational expression R 1 /Rfx100<25. Also, the length and the width of the wiring between the output or power supply pad and the capacitor(s) and the length and the width of the wiring between the capacitor(s) and the grounding pad are adjusted so that the impedance Za caused by the parasitic resistance component Ra and the inductance component La of the wiring between the output or power supply pad and the capacitor(s), the impedance Zk caused by the parasitic resistance component Rk and the inductance component Lk of the wiring between the capacitor(s) and the grounding pad, and the impedance Zc caused by the capacitance component of the capacitor(s) always satisfy the relational expression Za+Zk<Zc in the frequency range of the electromagnetic noises to be cut. The semiconductor apparatus and the physical quantity sensing apparatus are provided with countermeasures against electromagnetic noises to meet the demand for automotive sensors.
申请公布号 US2006244101(A1) 申请公布日期 2006.11.02
申请号 US20060278429 申请日期 2006.04.03
申请人 FUJI ELECTRIC DEVICE TECHNOLOGY CO., LTD. 发明人 UEMATSU KATSUYUKI;UEYANAGI KATSUMICHI
分类号 H01L29/00 主分类号 H01L29/00
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