发明名称 |
Wire bonded semiconductor device having low inductance and noise |
摘要 |
A semiconductor device has a semiconductor chip with a periphery and an IC organized in a core portion and a peripheral portion. The IC has a top level of interconnecting metal traces ( 510 ) from the peripheral portion to the core portion; the traces are covered by an insulating overcoat ( 520 ) which has peripheral windows to expose bond pads. The circuit further has at least one level of metal lines ( 511 ) on top of the insulating overcoat; the lines lead from the chip periphery towards the chip core, wherein each line ( 511 ) is substantially parallel to one of the traces ( 510 ) underneath the insulating overcoat and vertically aligned therewith. After assembling the chip onto a leadframe with segments ( 504 ), bonding wires ( 502 ) connect the bond pads ( 510 a) and the metal lines ( 511 a) with the segments.
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申请公布号 |
US2006244154(A1) |
申请公布日期 |
2006.11.02 |
申请号 |
US20050117878 |
申请日期 |
2005.04.29 |
申请人 |
TEST HOWARD R;LAMSON MICHAEL A |
发明人 |
TEST HOWARD R.;LAMSON MICHAEL A. |
分类号 |
H01L23/48 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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