发明名称 Wire bonded semiconductor device having low inductance and noise
摘要 A semiconductor device has a semiconductor chip with a periphery and an IC organized in a core portion and a peripheral portion. The IC has a top level of interconnecting metal traces ( 510 ) from the peripheral portion to the core portion; the traces are covered by an insulating overcoat ( 520 ) which has peripheral windows to expose bond pads. The circuit further has at least one level of metal lines ( 511 ) on top of the insulating overcoat; the lines lead from the chip periphery towards the chip core, wherein each line ( 511 ) is substantially parallel to one of the traces ( 510 ) underneath the insulating overcoat and vertically aligned therewith. After assembling the chip onto a leadframe with segments ( 504 ), bonding wires ( 502 ) connect the bond pads ( 510 a) and the metal lines ( 511 a) with the segments.
申请公布号 US2006244154(A1) 申请公布日期 2006.11.02
申请号 US20050117878 申请日期 2005.04.29
申请人 TEST HOWARD R;LAMSON MICHAEL A 发明人 TEST HOWARD R.;LAMSON MICHAEL A.
分类号 H01L23/48 主分类号 H01L23/48
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