发明名称 |
POLISHING APPARATUS, SEMICONDUCTOR-DEVICE MANUFACTURING METHOD USING SAME APPARATUS, AND SEMICONDUCTOR DEVICE MANUFACTURED BY SAME MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a polishing apparatus which prevents an offset load from acting on a wafer when its polishing pad overhangs the wafer. <P>SOLUTION: In the polishing apparatus, a first holder 65 of a plate member 61 having magnetism is so moved upward by a magnetic field generated from an electromagnet 35 disposed above a polishing pad 40 so as to be attracted to the polishing pad 40. Therefore, the polishing apparatus is so constituted that the polished surface 51 of a wafer 50 held by the first holder 65 is contacted with the polishing surface 41 of the polishing pad 40. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2006303274(A) |
申请公布日期 |
2006.11.02 |
申请号 |
JP20050124577 |
申请日期 |
2005.04.22 |
申请人 |
NIKON CORP |
发明人 |
SUGAYA ISAO |
分类号 |
H01L21/304;B24B37/005;B24B37/04;B24B37/30;B24B41/06 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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