发明名称 |
RESISTANCE MEMORY CELL, METHOD FOR FORMING SAME AND ARRANGEMENT THEREOF USING SAME METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a resistance memory cell, a method for forming the resistance memory cell, and an arrangement of the resistance memory cell by using the method. <P>SOLUTION: There are provided a resistance memory cell whose memory device is made of photoimageable switchable material reversibly switchable between distinguishable conditions of resistances patterned by actinic irradiation, and a method for forming the same. Since the photoimageable switchable material can be patterned directly by the actinic irradiation, the resistance memory cell can be manufactured through a simple process. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2006303493(A) |
申请公布日期 |
2006.11.02 |
申请号 |
JP20060111144 |
申请日期 |
2006.04.13 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
CHO BYEONG-OK;LEE MOON-SOOK;YASUE TAKAHIRO |
分类号 |
H01L27/10;G03F7/004;G03F7/031;G03F7/038;H01L27/28;H01L45/00;H01L49/00;H01L51/05;H01L51/30;H01L51/40 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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