发明名称 RESISTANCE MEMORY CELL, METHOD FOR FORMING SAME AND ARRANGEMENT THEREOF USING SAME METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a resistance memory cell, a method for forming the resistance memory cell, and an arrangement of the resistance memory cell by using the method. <P>SOLUTION: There are provided a resistance memory cell whose memory device is made of photoimageable switchable material reversibly switchable between distinguishable conditions of resistances patterned by actinic irradiation, and a method for forming the same. Since the photoimageable switchable material can be patterned directly by the actinic irradiation, the resistance memory cell can be manufactured through a simple process. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006303493(A) 申请公布日期 2006.11.02
申请号 JP20060111144 申请日期 2006.04.13
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 CHO BYEONG-OK;LEE MOON-SOOK;YASUE TAKAHIRO
分类号 H01L27/10;G03F7/004;G03F7/031;G03F7/038;H01L27/28;H01L45/00;H01L49/00;H01L51/05;H01L51/30;H01L51/40 主分类号 H01L27/10
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