| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a radiation detector and a radiation inspection apparatus capable of improving spatial resolution and detection efficiency. <P>SOLUTION: The detector 11 is constituted by alternately and densely layering first detection substrates 14a having semiconductor detection elements 21-1 and second detection substrates 14b having semiconductor detection elements 21-2 in the direction of an X-axis to detect gamma-rays incident approximately in the direction of Y. First wiring boards 33 are provided with the semiconductor detection elements 21-1 on their tip parts 33a in such a way that incident planes 21 of gamma-rays may be oriented in the direction of -Y, and bent parts 33b are provided for the base side of the first wiring substrate 33 in such a way as not to be in contact with electrodes 23 of the semiconductor detection elements 21-2 on the lower side. The detector may be provided with a constitution in which two semiconductor detection elements are provided for one wiring board at different heights in the direction of the X-axis. <P>COPYRIGHT: (C)2007,JPO&INPIT |
