发明名称 Micro-electromechanical probe circuit substrate
摘要 A MEMPCS having high stiffness against bending deformation or distortion is formed by integrating the probe, electronic circuit, circuit connecting pad and dielectric material into a complete unit with flexible multiple-layered substrate structure, and the part of the probe extended outside the dielectric material is further wrapped with a protecting layer to form an reinforced structure for increasing high stiffness to the probe and for preventing environmental dirt and particle from getting into the gap existed between the probes of the MEMPCS.
申请公布号 US2006244468(A1) 申请公布日期 2006.11.02
申请号 US20060411125 申请日期 2006.04.26
申请人 DONG WEN-CHANG 发明人 DONG WEN-CHANG
分类号 G01R31/02;G01R1/06 主分类号 G01R31/02
代理机构 代理人
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