METHOD FOR CLASSIFICATION OF CARBON NANOTUES AND OTHER MATERIALS

摘要

A method for identification of a material by analysis of a sample of the material is disclosed. The method comprises illuminating the sample with a plurality of excitation wavelengths, measuring a plurality of emission wavelengths for each excitation wavelengths to define a measured three-dimensional intensity contour. The values of maxima are located in the three-dimensional intensity contour and are compared to a library of values of known maxima associated with known species. A model of a three-dimensional intensity contour is generated and compared to the measured three-dimensional contour to determine residual errors. A comparison of errors between the generated and measured three-dimensional contours. Error minimization is used to determine the correct model of the three dimensional intensity contour.