发明名称 |
USING A PARAMETRIC MEASUREMENT UNIT FOR CONVERTER TESTING |
摘要 |
In one aspect, the invention is an integrated circuit (IC) for use in testing an analog-to-digital (ADC) converter includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the ADC. The IC also includes a first digital-to-analog converter (DAC) connected to the first channel of the PMU. The DAC has a DC level of accuracy of less than 1 millivolt.In another aspect, the invention is an integrated circuit (IC) for use in testing a digital-to-analog-converter-device-under-test (DACDUT). The IC includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the DACDUT and including an output port for taking measurements, a first digital-to-analog converter (DAC) connected to the first channel of the PMU and a PMU measurement path connected to the output port having a DC level of accuracy of less than 1 mV.
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申请公布号 |
WO2006071635(A3) |
申请公布日期 |
2006.11.02 |
申请号 |
WO2005US46132 |
申请日期 |
2005.12.16 |
申请人 |
TERADYNE, INC.;WALKER, ERNEST P.;SARTSCHEV, RONALD A. |
发明人 |
WALKER, ERNEST P.;SARTSCHEV, RONALD A. |
分类号 |
H03M1/10;H03M1/06 |
主分类号 |
H03M1/10 |
代理机构 |
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主权项 |
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地址 |
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