发明名称 Etching technique for the fabrication of thin (AI, In, Ga)N layers
摘要 An etching technique for the fabrication of thin (Al, In, Ga)N layers. A suitable template or substrate is selected and implanted with foreign ions over a desired area to create ion implanted material. A regrowth of a device structure is then performed on the implanted template or substrate. The top growth surface of the template is bonded to a carrier wafer to created a bonded template/carrier wafer structure. The substrate is removed, as is any residual material, to expose the ion implanted material. The ion implanted material on the bonded template/carrier wafer structure is then exposed to a suitable etchant for a sufficient time to remove the ion implanted material.
申请公布号 US2006246722(A1) 申请公布日期 2006.11.02
申请号 US20060403288 申请日期 2006.04.13
申请人 SPECK JAMES S;HASKELL BENJAMIN A;PATTISON P M;BAKER TROY J 发明人 SPECK JAMES S.;HASKELL BENJAMIN A.;PATTISON P. M.;BAKER TROY J.
分类号 C23F1/00;B44C1/22;H01L21/302 主分类号 C23F1/00
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