发明名称 |
CMOS IMAGE SENSOR, AND METHOD FOR FABRICATING THE SAME |
摘要 |
A CMOS is provided to obtain a high-quality image by improving a light absorption efficiency and quantum efficiency of a photodiode that receives light and converts the received light into current. A silicon substrate(201) of first conductivity type is prepared. A SiGe epitaxial layer(203) is formed on the silicon substrate to increase light sensitivity. A Si epitaxial layer(204) for depositing an oxide layer is formed on the SiGe epitaxial layer. A transistor is formed on the resultant structure. A photodiode impurity region(209) is formed in the SiGe epitaxial layer.
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申请公布号 |
KR20060113295(A) |
申请公布日期 |
2006.11.02 |
申请号 |
KR20050036587 |
申请日期 |
2005.04.30 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
CHA, HAN SEOB |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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