发明名称 CMOS IMAGE SENSOR, AND METHOD FOR FABRICATING THE SAME
摘要 A CMOS is provided to obtain a high-quality image by improving a light absorption efficiency and quantum efficiency of a photodiode that receives light and converts the received light into current. A silicon substrate(201) of first conductivity type is prepared. A SiGe epitaxial layer(203) is formed on the silicon substrate to increase light sensitivity. A Si epitaxial layer(204) for depositing an oxide layer is formed on the SiGe epitaxial layer. A transistor is formed on the resultant structure. A photodiode impurity region(209) is formed in the SiGe epitaxial layer.
申请公布号 KR20060113295(A) 申请公布日期 2006.11.02
申请号 KR20050036587 申请日期 2005.04.30
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 CHA, HAN SEOB
分类号 H01L27/146 主分类号 H01L27/146
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