发明名称 PAD OF CHEMICAL MECHANICAL POLISHING DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A pad of a CMP apparatus is provided to extend an interval of polishing time and improve polishing uniformity while simplifying a fabricating process by fixing a plurality of capsules with pores to a support layer while using a binder so that a plurality of layers for constituting a pad is formed. A polishing member(22) is formed on a support layer(21), made of at least one layer. The layer includes a plurality of capsules(22a) and a binder(22b). The plurality of capsules whose inside is empty are separated from each other by a uniform interval. The plurality of capsules are fixed to the upper part of the support layer by using a binder. The capsules are made of polymer having pores in its inside or made of water-soluble PVA(polyvinyl alcohol[acetate]) or starch.
申请公布号 KR20060113291(A) 申请公布日期 2006.11.02
申请号 KR20050036582 申请日期 2005.04.30
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 SONG, SEO YOUNG;KANG, YOUNG SOO
分类号 H01L21/304 主分类号 H01L21/304
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