| 摘要 |
PROBLEM TO BE SOLVED: To provide an analytical sample preparation method and device capable of preparing concurrently a plate-ike sample having a fresh surface from which an oxide layer, a contaminant and the like are removed, and a fresh micropiece from which an oxide layer, a contaminant and the like are removed, for X-ray fluorometric analysis/emission spectrochemical analysis or the like for steel or nonferrous metal, and for gas analysis, by one device. SOLUTION: This method uses a milling machine provided with a taper-forming cutting edge (a) for cutting a peripheral part of a cut face into a tapered shape, and a micropiece forming cutting edge (b) for cutting the cut face formed with a tapered shape of periphery by the (a) to form the micropiece for the gas analysis, in a rotary head, as the milling machine, when cutting the micropiece from the cut face of an analytical specimen having a cross section of a substantially circular rod shape or disk shape by the milling machine. COPYRIGHT: (C)2007,JPO&INPIT
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