| 摘要 |
The invention relates to a method for automatic defect recognition in testpieces by means of an X-ray examination unit with an X-ray tube, a detector and a mechanical manipulator for positioning the testpiece in the beam path of the X-ray examination unit, wherein a positioning image of the testpiece is compared with an ideal reference image. It is provided according to the invention that the axis of rotation, the angle of rotation and the displacement vector are calculated in order to arrive at an exact congruence of the positioning image of the testpiece with the ideal reference image, the values of the axis of rotation, angle of rotation and displacement vector are then relayed to the mechanical manipulator and the latter then transfers the testpiece into the position corresponding to these values and in this position a comparison image of the testpiece, which serves for comparison with an X-ray reference image, is produced by means of X-ray beams in the X-ray examination unit.
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