发明名称 Polishing composition
摘要 The present invention relates to a polishing composition containing a colloidal silica prepared from a silicate, the colloidal silica having an average particle size of primary particles of 1 nm or more and less than 40 nm, and water, wherein a density of silanol group on the surface of the colloidal silica is from 0.06 to 0.3 mmol per 1 g of the colloidal silica; a process for preparing the above polishing composition; a method for reducing nano scratches of a substrate and a method for manufacturing a substrate, each including the step of polishing a substrate to be polished with a polishing composition comprising a colloidal silica prepared from a silicate, the colloidal silica having an average particle size of primary particles of 1 nm or more and less than 40 nm, and water, wherein a density of silanol group on the surface of the colloidal silica is adjusted to a range from 0.06 to 0.3 mmol per 1 g of the colloidal silica. The polishing composition is suitable for polishing substrates for precision parts including, for instance, substrates for magnetic recording media, such as magnetic disks, optical disks, and opto-magnetic disks, photomask substrates, optical lenses, optical mirrors, optical prisms and semiconductor substrates, and the like.
申请公布号 US2006245995(A1) 申请公布日期 2006.11.02
申请号 US20060477952 申请日期 2006.06.30
申请人 YOSHIDA HIROYUKI 发明人 YOSHIDA HIROYUKI
分类号 C01B33/20;B24D3/02;C09G1/02;C09K3/14 主分类号 C01B33/20
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