发明名称 PHOTOTHERMAL INSPECTION CAMERA HAVING AN OFFSET ADJUSTING DEVICE
摘要 <p>This photothermal inspection camera (16) comprises: a system (22) for forming a laser beam (4) having a device (40) for lengthening the section of the beam for forming, on a surface of a part (1) to be examined, a heating zone (2) lengthened along one direction; a matrix (8) of infrared detectors for detecting an infrared radiation (5) emitted by a detection zone (3) on the surface (1a) of the part (1) with regard to the heating zone (2), and; a unit (46) for processing signals furnished by the infrared detectors in order to construct a thermographic image of the surface (1a) of this part (1) by scanning the surface (1a) via the heating zone (2). The camera comprises a system for mechanically adjusting an offset (d) between the lengthened heating zone (2) and the detection zone (3). The invention is for use in the non-destructive testing of parts.</p>
申请公布号 WO2006114487(A1) 申请公布日期 2006.11.02
申请号 WO2006FR00663 申请日期 2006.03.27
申请人 AREVA NP;PIRIOU, MARC;LEGRANDJACQUES, LAURENT 发明人 PIRIOU, MARC;LEGRANDJACQUES, LAURENT
分类号 G01N25/72 主分类号 G01N25/72
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