发明名称 |
Semiconductor device and method of manufacture thereof |
摘要 |
A semiconductor device includes a semiconductor substrate having a first surface. First gate electrodes are formed along a first direction on the first surface. Source/drain areas are formed in the first surface and sandwich a channel region. A first interlayer insulating layer fills a region between the first gate electrodes and has the top lower than the tops of the first gate electrodes. A second interlayer insulating layer is formed above the first gate electrodes and the first interlayer insulating layer. Interconnect layers are formed in the second interlayer insulating layer along a direction which intersects the first direction and is insulated from each other. A region between the interconnect layers is filled with the second interlayer insulating layer. A contact plug is formed in the first and second interlayer insulating layers and is in contact with the interconnect layer and the source/drain area.
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申请公布号 |
US2006244018(A1) |
申请公布日期 |
2006.11.02 |
申请号 |
US20050219724 |
申请日期 |
2005.09.07 |
申请人 |
KUTSUKAKE HIROYUKI;MATSUNAGA YASUHIKO;MIYAZAKI SHOICHI |
发明人 |
KUTSUKAKE HIROYUKI;MATSUNAGA YASUHIKO;MIYAZAKI SHOICHI |
分类号 |
H01L29/76;H01L23/52 |
主分类号 |
H01L29/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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