发明名称 FRESNEL ZONE PLATE AND X-RAY MICROSCOPE USING THE FRESNEL ZONE PLATE
摘要 <p>[PROBLEMS] To provide a Fresnel zone plate having a complex irradiation function capable of improving resolution even when the outermost opaque band width cannot be reduced and an X-ray microscope using the Fresnel zone plane. [MEANS FOR SOLVING PROBLEMS] A Fresnel zone plate (1) having complex irradiation function have opaque bands (3) and transparent bands (4) arranged alternately in the radial direction from the center of a flat transparent substrate (2). The Fresnel zone plate have a transmission widow (7) so that a part of plane wave vertically applied onto the upper surface of the substrate (2) vertically advances directly to a sample (6) arranged below the Fresnel zone plate (1).</p>
申请公布号 WO2006115114(A1) 申请公布日期 2006.11.02
申请号 WO2006JP308108 申请日期 2006.04.18
申请人 ENDOH, HISAMITSU;KYOTO INSTITUTE OF TECHNOLOGY 发明人 ENDOH, HISAMITSU
分类号 G01N23/04;G21K1/06;G02B5/18;G02B21/00;G21K7/00 主分类号 G01N23/04
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