发明名称 |
FRESNEL ZONE PLATE AND X-RAY MICROSCOPE USING THE FRESNEL ZONE PLATE |
摘要 |
<p>[PROBLEMS] To provide a Fresnel zone plate having a complex irradiation function capable of improving resolution even when the outermost opaque band width cannot be reduced and an X-ray microscope using the Fresnel zone plane. [MEANS FOR SOLVING PROBLEMS] A Fresnel zone plate (1) having complex irradiation function have opaque bands (3) and transparent bands (4) arranged alternately in the radial direction from the center of a flat transparent substrate (2). The Fresnel zone plate have a transmission widow (7) so that a part of plane wave vertically applied onto the upper surface of the substrate (2) vertically advances directly to a sample (6) arranged below the Fresnel zone plate (1).</p> |
申请公布号 |
WO2006115114(A1) |
申请公布日期 |
2006.11.02 |
申请号 |
WO2006JP308108 |
申请日期 |
2006.04.18 |
申请人 |
ENDOH, HISAMITSU;KYOTO INSTITUTE OF TECHNOLOGY |
发明人 |
ENDOH, HISAMITSU |
分类号 |
G01N23/04;G21K1/06;G02B5/18;G02B21/00;G21K7/00 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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