发明名称 APPARATUS FOR MEASURING INFRARED BEAM AND METHOD FOR MEASURING INFRARED BEAM
摘要 An apparatus and a method for measuring an infrared ray are provided to measure the infrared ray even in a lighted area by using a projection unit and a light receiving element. A projection unit(100) projects infrared rays having a predetermined waveform. A light receiving unit(200) includes a plurality of light receiving elements for receiving the infrared rays and generating signals corresponding to the infrared rays. A signal processing unit(400) determines light receiving states of the infrared rays generated from the light receiving elements and determines the magnitude of infrared rays from the states of the infrared rays. The magnitude of the signal generated from the light receiving element is proportional to the magnitude of the infrared rays received from the projection part.
申请公布号 KR100643700(B1) 申请公布日期 2006.11.01
申请号 KR20050036838 申请日期 2005.05.02
申请人 S1 CORPORATION 发明人 HWANG, HO YOUNG
分类号 G01V8/10 主分类号 G01V8/10
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