发明名称 |
Method for forming a multi-layer low-K dual damascene |
摘要 |
A damascene structure and method for forming the same in a multi-density dielectric insulating layer the method including providing a substrate; forming at least a first layer comprising silicon oxide according to a first process having a first density; forming at least a second layer comprising silicon oxide according to a second process over the first layer having a second density less than the first density; etching a damascene opening through a thickness portion of the at least a first and the at least a second layer; and, filling the damascene opening to form a metal filled damascene.
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申请公布号 |
US7129164(B2) |
申请公布日期 |
2006.10.31 |
申请号 |
US20040968199 |
申请日期 |
2004.10.18 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
CHANG HUI LIN;LU YUNG CHENG;LI LI PING;BAO TIEN I;LIN CHIH HSIEN |
分类号 |
H01L21/4763 |
主分类号 |
H01L21/4763 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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