发明名称 Fin-shaped semiconductor device
摘要 A semiconductor layer in which a primary part of a FinFET is formed, i.e., a fin has a shape which is long in a direction x and short in a direction y. A width of the fin in the direction y changes on three stages. First, in a channel area between gate electrodes each having a gate length Lg, the width of the fin in the direction y is Wch. Further, the width of the fin in the direction y in a source/drain extension area adjacent to the channel area in the direction x is Wext (>Wch). Furthermore, the width of the fin in the direction y in a source/drain area adjacent to the source/drain extension area in the direction x is Wsd (>Wext).
申请公布号 US7129550(B2) 申请公布日期 2006.10.31
申请号 US20040775017 申请日期 2004.02.09
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 FUJIWARA MAKOTO;ISHIMARU KAZUNARI;HOKAZONO AKIRA
分类号 H01L29/76;H01L21/336;H01L29/417;H01L29/45;H01L29/786;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L29/76
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