发明名称 SEMICONDUCTOR DEVICE HAVING SCREENING ELECTRODE AND METHOD
摘要 A semiconductor device having a screening electrode is provided to avoid an increase of gate-to-drain capacitance while preventing a breakdown voltage from being deteriorated by forming a semiconductor device in a body made of a semiconductor material and by including a screening electrode separated from a channel region. A substrate(12) has a main surface(18), including first conductivity type. A pedestal structure is formed on a part of the main surface. A conductive material is disposed along the lateral surface of the pedestal structure to confine the edge of a first conductive electrode of a semiconductor device. A first doped region of second conductivity type is formed in the main surface adjacent to the first conductive electrode. A part of the first doped region forms a channel region when the semiconductor device operates. A first current transfer region of first conductivity type is formed in the first doped region. A screening electrode adjoins the main surface, close to the first doped region and including a trench, a dielectric layer and a conductive layer. The trench is formed in the main surface. The dielectric layer is formed on the surface of the trench. The conductive layer is formed on the dielectric layer.
申请公布号 KR20060111859(A) 申请公布日期 2006.10.30
申请号 KR20060037060 申请日期 2006.04.25
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, L.L.C. 发明人 LOECHELT GARY H.;ZDEBEL PETER J.
分类号 H01L21/336 主分类号 H01L21/336
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