发明名称 |
SEMICONDUCTOR DEVICE HAVING SCREENING ELECTRODE AND METHOD |
摘要 |
A semiconductor device having a screening electrode is provided to avoid an increase of gate-to-drain capacitance while preventing a breakdown voltage from being deteriorated by forming a semiconductor device in a body made of a semiconductor material and by including a screening electrode separated from a channel region. A substrate(12) has a main surface(18), including first conductivity type. A pedestal structure is formed on a part of the main surface. A conductive material is disposed along the lateral surface of the pedestal structure to confine the edge of a first conductive electrode of a semiconductor device. A first doped region of second conductivity type is formed in the main surface adjacent to the first conductive electrode. A part of the first doped region forms a channel region when the semiconductor device operates. A first current transfer region of first conductivity type is formed in the first doped region. A screening electrode adjoins the main surface, close to the first doped region and including a trench, a dielectric layer and a conductive layer. The trench is formed in the main surface. The dielectric layer is formed on the surface of the trench. The conductive layer is formed on the dielectric layer.
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申请公布号 |
KR20060111859(A) |
申请公布日期 |
2006.10.30 |
申请号 |
KR20060037060 |
申请日期 |
2006.04.25 |
申请人 |
SEMICONDUCTOR COMPONENTS INDUSTRIES, L.L.C. |
发明人 |
LOECHELT GARY H.;ZDEBEL PETER J. |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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