发明名称 Resist pattern forming method and resist pattern forming system
摘要 There is provided a resist pattern forming method which makes it possible to form fine resist patterns with a high aspect ratio by using a non-chemically amplified resist easy to treat. In the resist pattern forming method, a resist layer is formed on a substrate by applying a non-chemically amplified resist onto the substrate. Then, the resist layer is exposed. Thereafter, the substrate subjected to the exposure is baked at a temperature not lower than 90
申请公布号 SG125942(A1) 申请公布日期 2006.10.30
申请号 SG20040001423 申请日期 2004.03.15
申请人 TDK CORPORATION 发明人 NAKADA KATSUYUKI;HATTORI KUZUHIRO
分类号 G03F7/38;G03C5/00;G03F7/039;G03F7/40;H01L21/027 主分类号 G03F7/38
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