发明名称 Method of forming strained silicon on insulator substrate
摘要 A method of forming a strained-silicon-on-insulator substrate is disclosed. A target wafer (200) includes an insulator layer (212) on a substrate. A donor wafer (400) includes a bulk semiconductor substrate having a lattice constant different from the lattice constant of silicon and a strained silicon layer (210) formed on the bulk semiconductor substrate. The top surface of the donor wafer is bonded (438) to the top surface of the target wafer. The strained silicon layer is then separated from the donor wafer so that the strained silicon layer adheres to the target wafer. The bond between the strained silicon layer (210) and the target wafer can then be strengthened.
申请公布号 SG125932(A1) 申请公布日期 2006.10.30
申请号 SG20040000560 申请日期 2004.02.10
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD 发明人 YEO YEE-CHIA;LEE WEN-CHIN
分类号 H01L21/762;H01L29/10;H01L29/49;H01L29/786 主分类号 H01L21/762
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