发明名称 Optical component e.g. phase shift mask, forming method for microelectronic application, involves inserting adjustment layer between stack, etching stack and layer parts and annealing layer to contract it to less than one nanometer
摘要 The method involves forming an extreme ultraviolet reflecting multilayer stack (32, 34) and inserting an adjustment layer (30) between the multilayer stack, where the adjustment layer is formed of a metal-semiconductor mixture. Parts of the multilayer stack and the adjustment layer are etched. The adjustment layer is then annealed for contracting the layer to less than 1 nanometer. The adjustment layer includes a barrier layer interface in the multilayer stack.
申请公布号 FR2884965(A1) 申请公布日期 2006.10.27
申请号 FR20050051078 申请日期 2005.04.26
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE ETABLISSEMENT PUBLIC A CARACTERE SCIENTIFIQUE TECHNIQUE ET INDUSTRIEL 发明人 QUESNEL ETIENNE
分类号 H01L21/027;G03F1/00;G03F7/20 主分类号 H01L21/027
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