发明名称 Chemical Mechanical Polishing Apparatus and Methods Using a Polishing Surface with Non-Uniform Rigidity
摘要 A chemical mechanical polishing apparatus includes a platen, a polishing pad affixed to a surface of the platen, and a polishing head configured to retain and rotate a wafer while pressing a surface of the rotating wafer against the polishing pad. A first portion of the polishing pad that engages the polishing head proximate the edge of the wafer provides less rigidity than a second portion of the polishing pad that engages a portion of the surface of the wafer. For example, the polishing pad and/or the platen may have a recess or other cushioning structure positioned proximate a locus of movement of a portion of the polishing head that supports the edge of the wafer.
申请公布号 US2006240749(A1) 申请公布日期 2006.10.26
申请号 US20060427360 申请日期 2006.06.29
申请人 YUN HYUN J;LIM YOUNG S;BOO JAE P 发明人 YUN HYUN J.;LIM YOUNG S.;BOO JAE P.
分类号 B24B7/30;B24B29/00;B24B37/20;B24B37/24;B24D11/00;B24D13/14;H01L21/304 主分类号 B24B7/30
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