摘要 |
<p>Silicon wafers and the like are cleaned using new scrubber-type apparatus in which measures are taken to compensate for differential cleaning of the central region of the wafer by: using rotary brushes having one or more non-contact portions arranged in the section thereof that faces the central region of the substrate, or toggling the relative position of the wafer and the rotary brushes, or directing cleaning fluid(s) preferentially towards the central region of the wafer. Another aspect of the invention provides scrubber-type cleaning apparatus in which the rotary brushes are replaced by rollers (110). A web of cleaning material (116) is interposed between each roller and the substrate. Various different webs of cleaning material may be used, e.g. a length of tissue, a continuous loop of cleaning material whose surface is reconditioned on each cleaning pass, adhesive material provided on a carrier tape, etc.</p> |
申请人 |
FREESCALE SEMICONDUCTOR, INC.;KONINKLIJKE PHILIPS ELECTRONICS N.V.;FARKAS, JANOS;KORDIC, SRDJAN;PETITDIDIER, SEBASTIEN;COOPER, KEVIN, E.;VAN-HASSEL, JAN |
发明人 |
FARKAS, JANOS;KORDIC, SRDJAN;PETITDIDIER, SEBASTIEN;COOPER, KEVIN, E.;VAN-HASSEL, JAN |