发明名称 APPARATUS FOR CLEANING OF CIRCUIT SUBSTRATES
摘要 <p>Silicon wafers and the like are cleaned using new scrubber-type apparatus in which measures are taken to compensate for differential cleaning of the central region of the wafer by: using rotary brushes having one or more non-contact portions arranged in the section thereof that faces the central region of the substrate, or toggling the relative position of the wafer and the rotary brushes, or directing cleaning fluid(s) preferentially towards the central region of the wafer. Another aspect of the invention provides scrubber-type cleaning apparatus in which the rotary brushes are replaced by rollers (110). A web of cleaning material (116) is interposed between each roller and the substrate. Various different webs of cleaning material may be used, e.g. a length of tissue, a continuous loop of cleaning material whose surface is reconditioned on each cleaning pass, adhesive material provided on a carrier tape, etc.</p>
申请公布号 WO2006111193(A1) 申请公布日期 2006.10.26
申请号 WO2005EP05552 申请日期 2005.04.20
申请人 FREESCALE SEMICONDUCTOR, INC.;KONINKLIJKE PHILIPS ELECTRONICS N.V.;FARKAS, JANOS;KORDIC, SRDJAN;PETITDIDIER, SEBASTIEN;COOPER, KEVIN, E.;VAN-HASSEL, JAN 发明人 FARKAS, JANOS;KORDIC, SRDJAN;PETITDIDIER, SEBASTIEN;COOPER, KEVIN, E.;VAN-HASSEL, JAN
分类号 H01L21/00 主分类号 H01L21/00
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