发明名称 THIN FILM DEVICE AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a technology for controlling occurrence of a trouble such as cracking of a thin film element layer in a thin film device where a substrate and the thin film element layer are bonded through adhesive. SOLUTION: The thin film device comprises a substrate (22), an adhesive layer (24) provided on one surface of the substrate, a thin film element layer (14) including a thin film element and bonded to one surface side of the substrate by the adhesive layer, and a protective layer (16) composed of a material having a thermal expansion coefficient substantially equal to that of the constitutional material of the substrate and covering the upper side of the thin film element layer substantially entirely. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006295033(A) 申请公布日期 2006.10.26
申请号 JP20050116733 申请日期 2005.04.14
申请人 SEIKO EPSON CORP 发明人 KODAIRA YASUAKI
分类号 H01L27/12;H01L21/02 主分类号 H01L27/12
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