发明名称 Fuse detection method and semiconductor memory device including fuse detection circuit
摘要 A fuse detection method according to the present invention includes reading out a program state of each fuse and generating a killer signal indicating the program state of the fuse; counting the program state indicated by the killer signal to obtain a count value; inputting an expected value for the program state of the fuse; and determining whether the count value coincides with the expected value by comparing the count value with the expected value.
申请公布号 US2006239101(A1) 申请公布日期 2006.10.26
申请号 US20060397689 申请日期 2006.04.05
申请人 ELPIDA MEMORY, INC 发明人 TANAKA HAJIME;KAWAMATA YOSUKE
分类号 G11C17/18 主分类号 G11C17/18
代理机构 代理人
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