| 发明名称 |
Scanning probe microscope assembly and method for making spectrophotometric, near-filed, and scanning probe measurements |
| 摘要 |
A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object.
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| 申请公布号 |
US2006237639(A1) |
申请公布日期 |
2006.10.26 |
| 申请号 |
US20060355260 |
申请日期 |
2006.02.14 |
| 申请人 |
GENERAL NANOTECHNOLOGY LLC |
发明人 |
KLEY VICTOR B. |
| 分类号 |
G01Q60/10;H01J3/14;G01B5/28;G01Q20/02;G01Q30/02;G01Q30/04;G01Q60/02;G01Q60/18;G01Q60/24;G01Q70/02;G01Q70/10;G01Q70/14;G02B21/00;G03F1/00;G03F7/20;G11B5/23;G11B5/31 |
主分类号 |
G01Q60/10 |
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