发明名称 Submicron particle removal
摘要 A system for non-contact cleaning of particulate contamination of surfaces includes one or more sources that create a charge imbalance between a surface and particles that contaminate the surface, and a power supply that creates a pulsed electrical bias on the surface. This imbalance produces an electrostatic force that propels the particles off the surface. The cleaning process can be associated, for example, with microelectronic lithography and manufacturing.
申请公布号 US2006237667(A1) 申请公布日期 2006.10.26
申请号 US20050293903 申请日期 2005.12.05
申请人 RUZIC DAVID N;JURCZYK BRIAN E;ALMAN DARREN;NEUMANN MARTIN J;QIU HUATAN 发明人 RUZIC DAVID N.;JURCZYK BRIAN E.;ALMAN DARREN;NEUMANN MARTIN J.;QIU HUATAN
分类号 G21G5/00;A61N5/00 主分类号 G21G5/00
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