发明名称 ION IMPLANTATION DEVICE AND METHOD
摘要 An ion implantation device and a method of manufacturing a semiconductor device is described, wherein ionized boron hydride molecular clusters are implanted to form P-type transistor structures. For example, in the fabrication of Complementary Metal-Oxide Semiconductor (CMOS) devices, the clusters are implanted to provide P-type doping for Source and Drain structures and for Polygates; these doping steps are critical to the formation of PMOS transistors. The molecular cluster ions have the chemical form B<SUB>n</SUB>H<SUB>x</SUB> <SUP>+</SUP>
申请公布号 WO2004003973(A3) 申请公布日期 2006.10.26
申请号 WO2003US20197 申请日期 2003.06.26
申请人 SEMEQUIP INC.;HORSKY, THOMAS, N.;JACOBSON, DALE, C. 发明人 HORSKY, THOMAS, N.;JACOBSON, DALE, C.
分类号 H01J7/24;H01J27/20;H01J31/26;H01J37/08;H01J37/317;H01L21/00;H01L21/265;H01L21/336 主分类号 H01J7/24
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