发明名称 Method for improving SOG process
摘要 A method for forming a memory device includes providing a substrate, providing a plurality of features on the substrate, and forming a silicon-rich dielectric layer over the features. An inter-layer dielectric (ILD) or inter-metal dielectric (IMD) layer may be formed by a spin-on-glass (SOG) process on the silicon-rich dielectric layer, the silicon-rich dielectric layer preventing diffusion of a solvent used in the SOG process.
申请公布号 US2006237802(A1) 申请公布日期 2006.10.26
申请号 US20050110862 申请日期 2005.04.21
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 CHEN LEE-JEN;SU CHIN-TA;LIU KUANG-WEN;LU CHIEN-HUNG;LUO SHING-ANN
分类号 H01L29/76 主分类号 H01L29/76
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