发明名称 MANUFACTURING METHOD OF FLASH MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a flash memory device improving a margin in a photo process, preventing defects in pattern, and preventing defects such as photo mask collapse by decreasing aspect ratio of photo mask. SOLUTION: There is provided the manufacturing method of the flash memory device which includes steps of: forming an anti-reflection film and an etching suspension film on a substrate on which a predetermined lower pattern is formed; forming an insulating film on the anti-reflection film and the etching suspension film; forming a photoresist on the insulating film; patterning the photoresist; and forming a trench by etching the insulating film, anti-reflection film, and etching suspension film with the patterned photoresist as the masks. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006295172(A) 申请公布日期 2006.10.26
申请号 JP20060105764 申请日期 2006.04.07
申请人 HYNIX SEMICONDUCTOR INC 发明人 HWANG SUNG MIN
分类号 H01L21/8247;H01L21/027;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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