发明名称 Method for Manufacturing Semiconductor Device
摘要 A gate electrode is formed of a laminate structure comprising a plurality of conductive layers such that the width along the channel of a lower first conductive layer is larger than that of an upper second conductive layer The gate electrode is used as a mask during ion doping for forming an LDD. A mask pattern for forming the gate electrode is processed into an optimum shape in combination with dry etching so that the LDD overlapping with the gate electrode(Lov) is 1 mum or more, and preferably, 1.5 mum or more.
申请公布号 US2006240674(A1) 申请公布日期 2006.10.26
申请号 US20060456361 申请日期 2006.07.10
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MONOE SHIGEHARU
分类号 H01L21/302;H01L21/3065;H01L21/336;H01L21/461;H01L21/768;H01L29/41;H01L29/423;H01L29/49;H01L29/786 主分类号 H01L21/302
代理机构 代理人
主权项
地址