发明名称 IC with protocol selection memory coupled to serial scan path
摘要 A digital bus monitor used to observe data on a bus ( 14, 16, 18 ) connecting multiple integrated circuits ( 10, 12 ) comprises a memory buffer ( 30 ), bypass register ( 34 ), test port ( 38 ) and output control circuits ( 42, 46 ) controlled by an event qualifying module (EQM) ( 32 ). In response to a matching condition the EQM ( 32 ) may perform a variety of tests on incoming data while the integrated circuits ( 10, 12 ) continue to operate at speed. A plurality of digital bus monitors ( 20, 22 ) may be cascaded for observation and test of variable width data buses and variable width signature analysis.
申请公布号 US2006242523(A1) 申请公布日期 2006.10.26
申请号 US20060331715 申请日期 2006.01.13
申请人 发明人 WHETSEL LEE D.
分类号 G01R31/28 主分类号 G01R31/28
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