发明名称 Workpiece inspection system
摘要 An inspection station for a workpiece including a conveyor, a mechanism for rotating the workpiece, and a probe. The conveyor includes a fixture for locating the workpiece and the conveyor is configured to translate the workpiece in a linear manner. A mechanism, such as a belt, engages the workpiece thereby rotating the workpiece within the fixture. The probe is configured to indicate if the workpiece conforms to quality criteria. To facilitate inspection while the conveyor translates the workpiece, the probe is attached to a stage where the stage is configured to move the probe synchronously with the workpiece over an inspection region.
申请公布号 US2006236792(A1) 申请公布日期 2006.10.26
申请号 US20050112446 申请日期 2005.04.22
申请人 MECTRON ENGINEERING COMPANY 发明人 HANNA JAMES L.
分类号 G01M99/00 主分类号 G01M99/00
代理机构 代理人
主权项
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