| 摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus and method for testing a device by which a test can be speeded up by shortening time for writing data. SOLUTION: A write-in means 105 sequentially writes only the data to be applied to a device to be tested selected by a tested device selection means 103. Also, a storage means 106 stores the data to be applied to the device to be tested. A read-in means 107 reads the data from the storage means 106 and applied them to the device to be tested. A 1st write-in means 108 writes the data into the storage means 106 continuously in a unit of the device to be tested. A 2nd write-in means 109 writes data for a plurality of devices to be tested to the storage means in parallel. A write-in system selection means 110 selectively operates either the 1st write-in means 108 or the 2nd write-in means 109. COPYRIGHT: (C)2007,JPO&INPIT
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