发明名称 Surface roughness and/ or contour shape measuring apparatus
摘要 A surface roughness and/or contour shape measuring apparatus for measuring the surface shape of a work measurement surface by moving a probe supported on a cantilever and kept in contact with the work measurement surface and by detecting the displacement amount of the probe is disclosed. The surface roughness and the contour shape of a stepped work bottom portion having bank portions and the bottom portion can be easily measured. The surface roughness and/or contour shape measuring apparatus (1) includes a moving unit (8) for moving the work and the probe (9) relatively to each other in the direction (X) perpendicular to both the longitudinal direction (Z) of the probe (9) and the longitudinal direction (Y) of the cantilever (7).
申请公布号 EP1715288(A1) 申请公布日期 2006.10.25
申请号 EP20060111328 申请日期 2006.03.17
申请人 TOKYO SEIMITSU CO., LTD. 发明人 TANIUCHI, NOBUYUKI;KUBOTA, KAZUHIRO
分类号 G01B5/20 主分类号 G01B5/20
代理机构 代理人
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