发明名称 INTELLIGENT INTEGRATED DIAGNOSTICS
摘要 A diagnostics system comprising a topological map of a target system that has nodes (38, 40, 42, 44, 46, 48) that correspond to components (29, 30, 32, 34, 36) of the target system and links that correspond to connections between the components. Associated with the topological map is a knowledge store (50) that has a structure that reflects or corresponds to that of the topological map. Included in this store (50) is a plurality of sections or libraries each of which is provided for storing design specific data associated with one of the nodes (38, 40, 42, 44, 46, 48) of the topological map. Data received from one or more sensors on the target system is included in the topological map, and used together with the design specific information in the knowledge store to diagnose faults.
申请公布号 EP1714222(A2) 申请公布日期 2006.10.25
申请号 EP20040791622 申请日期 2004.10.29
申请人 SEEBYTE LTD;HERIOT-WATT UNIVERSITY 发明人 HAMILTON, KELVIN;BROWN, KEITH;TAYLOR, NICK;LANE, DAVID
分类号 G06F17/00;G05B23/02 主分类号 G06F17/00
代理机构 代理人
主权项
地址