发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A semiconductor memory device and a method of fabricating the same by using a recess channel array transistor are provided to minimize poor contact and to decrease a contact resistance of a source and a drain. A semiconductor substrate(100) is limited by a device isolation layer(10) and includes an active region where a trench(15) is formed for making at least one recess channel. An epitaxial layer(200) is formed on a whole surface of the active region except the trench and a portion of the device isolation layer. A gate is formed by filling the trench. A source and drain regions are formed to locate the gate between the source/drain regions. The epitaxial layer includes impurities to reduce a contact resistance of the source/drain electrode. A lateral spacer is formed on both lateral sides of the gate and a portion of a surface of the epitaxial layer. The epitaxial layer has a flat and uniform surface profile.
申请公布号 KR100640650(B1) 申请公布日期 2006.10.25
申请号 KR20050060795 申请日期 2005.07.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SUNG MIN;PARK, DONG GUN;YUN, EUN JUNG
分类号 H01L27/105;H01L21/336 主分类号 H01L27/105
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