发明名称 Charge trap insulator memory device
摘要 A charge trap insulator memory device comprises a plurality of memory cells connected serially, a first switching device, and a second switching device. In the plurality of memory cells, data applied through a bit line depending on potentials applied to a top word line and a bottom word line are stored in a charge trap insulator or the data stored in the charge trap insulator are outputted to the bit line. The first switching element selectively connects the plurality of memory cells to the bit line in response to a first selecting signal. The second switching element selectively connects the plurality of memory cells to a sensing line in response to a second selecting signal.
申请公布号 US7126185(B2) 申请公布日期 2006.10.24
申请号 US20050115135 申请日期 2005.04.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG HEE BOK;AHN JIN HONG;LEE JAE JIN
分类号 H01L29/788 主分类号 H01L29/788
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