发明名称 Defect repair apparatus for an electronic device
摘要 A method is described for repairing failure points, regions or locations in an electronic device to have a perfect function when a semiconductor device including an LCD of other electronic device has defects. Described is a method of transferring a single or multi-layer thin film piece into a recess with the physical properties of the thin film piece unchanged. An electronic device is described incorporating a substrate; and a plurality of thin films laminated on the substrate and part of the thin films are formed on a predetermined circuit pattern, wherein a transfer film for repairing a defect is fitted into a recess where the low layers of the thin films are exposed by removing part of a single or multi-layer thin films covering a defective portion included on the thin films and its surrounding portion. Further, a method of repairing a defective portion included in the electronic device comprises the steps of: removing the thin films covering the defective portion and its surrounding portion to form a recess and exposing the lower layers of the thin films; and fitting a transfer film into the recess to attach the transfer film onto the exposed thin films.
申请公布号 US7126232(B2) 申请公布日期 2006.10.24
申请号 US20040931894 申请日期 2004.09.01
申请人 AU OPTRONICS CORPORATION 发明人 IMAHARA KAZUMITSU;WADA KAKEHIKO
分类号 H01L21/3205;H01L23/58;B23K26/06;G02F1/13;G02F1/1343;G02F1/136;G02F1/1362;G02F1/1368;G09F9/00;H01L23/52;H01L29/786 主分类号 H01L21/3205
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