发明名称 Glide-height disk-tester and method of operation
摘要 A glide-height disk-tester operates with the test disk rotating at a predetermined constant rotational speed and uses a glide head with an electrically-resistive heater and a thermally-responsive protrusion pad located on its trailing end. The linear velocity of the disk relative to the slider maintains the slider at its nominal fly height, which is typically higher than any expected asperity. With no current applied to the heater, the protrusion pad is generally flush with the air-bearing surface of the slider. Increasing levels of current are applied to the heater, which causes movement of the protrusion pad toward the disk surface. When the pad contacts an asperity, the current level applied at the instant of asperity contact is recorded. The applied current level can be correlated to the glide height from a previous calibration process using a calibration disk with known calibration bump heights.
申请公布号 US7124625(B1) 申请公布日期 2006.10.24
申请号 US20050131736 申请日期 2005.05.17
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V. 发明人 KURITA MASAYUKI;PIT REMMELT;SAEGUSA SHOZO;SHIRAMATSU TOSHIYA;SUK MIKE;TANAKA HIDEAKI
分类号 G01B5/28;G01B21/30 主分类号 G01B5/28
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