发明名称 Circuit configuration having a load transistor and a current measuring configuration, method for ascertaining the load current in a load transistor, semiconductor component, and measuring configuration
摘要 A circuit configuration has a load transistor and a current measuring configuration. A method ascertains a load current through a load transistor. The circuit configuration includes a first and a second current sensor with a current measuring transistor in each case. Each of the current sensors provide a current measurement signal that is fed to an evaluation circuit. The evaluation circuit provides, from the first current measurement signal, a current measurement signal that is dependent on the load current. The load transistor and the current measuring transistors are preferably integrated in a common semiconductor body having a multiplicity of transistor cells of identical construction. The evaluation circuit preferably accounts for the spatial position of the cells of the first and second current measuring transistors in the cell array.
申请公布号 US7126354(B2) 申请公布日期 2006.10.24
申请号 US20030654696 申请日期 2003.09.04
申请人 INFINEON TECHNOLOGIES AG 发明人 DEBOY GERALD;ZVEREV ILIA
分类号 G01R27/08;G01R19/00;G05F3/16 主分类号 G01R27/08
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