发明名称 Method of manufacturing semiconductor device
摘要 A first CVD dielectric layer is deposited on a surface of a semiconductor substrate. Next, low-k layers are deposited in at least two different steps to form one of a via-layer dielectric film and a wiring-layer dielectric film on the first CVD dielectric layer. Immediately after the depositions, thermal treatment is performed. A second CVD dielectric layer is deposited on the low-k layers. A groove is formed in the second CVD dielectric layer and the low-k layers. A metal layer is deposited on that structure, filling the groove. The metal layer is removed from the second CVD dielectric layer by chemical mechanical polishing.
申请公布号 US7125794(B2) 申请公布日期 2006.10.24
申请号 US20040940820 申请日期 2004.09.15
申请人 RENESAS TECHNOLOGY CORP. 发明人 KONDO SEIICHI;MISAWA KAORI;TOKITOH SHUNICHI;NASUNO TAKASHI
分类号 H01L21/4763;H01L27/00;H01L21/28;H01L21/312;H01L21/314;H01L21/316;H01L21/318;H01L21/469;H01L21/768 主分类号 H01L21/4763
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