发明名称 Method and system for estimating manufacturing target bias
摘要 A computer implemented method for estimating manufacturing target bias for products in manufacturing tools. The method first establishes a first data set according to manufacturing target bias history based on a correlation with tools used. The manufacturing tools comprise a first manufacturing tool and other manufacturing tools. Next, a testing operation is executed for a predicted product in the first manufacturing tool to obtain a first predicted manufacturing target bias. Finally, manufacturing target bias of the predicted product in the other manufacturing tools is calculated according to the first data set and the first predicted manufacturing target bias.
申请公布号 US7127316(B2) 申请公布日期 2006.10.24
申请号 US20040994078 申请日期 2004.11.19
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 HSU YEN-PU;WEI CHENG HSIEN;WU MEI-JEN
分类号 G06F19/00 主分类号 G06F19/00
代理机构 代理人
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