| 摘要 |
This invention describes a means by which performance characteristics of capacitors can be improved. This is achieved by reducing the temperature, preferably but not exclusively to cryogenic temperatures below 100 K. This is based on the observation that the dielectric strength, dielectric losses and plate losses in many capacitors, such as film capacitors, improve as the temperature is decreased. A cryogenic capacitor bank is also described, which exhibits energy densities up to four times those of conventional, room-temperature capacitor banks. Cryogenic capacitors can be combined with cryogenically operated semiconductors or with superconductors in such a way as to reduce the size, weight, and losses of a complete system.
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