发明名称 RETAINING MECHANISM FOR WAFER
摘要 <p><P>PROBLEM TO BE SOLVED: To prevent a retaining table for retaining a wafer from being heated when the wafer is processed using a laser light. <P>SOLUTION: The retaining mechanism for the wafer includes: at least a wafer retaining part 7 having a retaining surface 7a for retaining the wafer W; and a suction part 21b formed on an outer peripheral side of the wafer retaining part 7, and retains the wafer W on the retaining surface 7a by suction force transmitted from the suction part 21b to the retaining surface 7a through an outer peripheral end of the wafer retaining part 7. Since suction/retaining is performed even if a fine pore reaching a back surface from a surface of the wafer retaining part 7 is not formed, the wafer retaining part 7 is constituted by selecting the best material having permeability and dispersion property relative to a wavelength of the laser light. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2006281434(A) 申请公布日期 2006.10.19
申请号 JP20050292307 申请日期 2005.10.05
申请人 DISCO ABRASIVE SYST LTD 发明人 OMIYA NAOKI;GENDA SATOSHI;TAKEDA NOBORU;TAKEYAMA KOICHI;MORISHIGE YUKIO;MORIKAZU YOJI;NOMURA HIROSHI
分类号 B23Q3/08;H01L21/301;H01L21/683 主分类号 B23Q3/08
代理机构 代理人
主权项
地址