发明名称 |
CONTACT PROBE FOR A TESTING HEAD HAVING VERTICAL PROBES FOR SEMICONDUCTOR INTEGRETED ELECTRONIC DEVICES |
摘要 |
<p>A contact probe (20) for a tasting head is described, of the type wherein a plurality of these probes are inserted in guide holes realised in respective dies, the probe comprising a rod-shaped body (21) equipped at an end with at least a contact tip (22) effective to ensure the mechanical and electrical contact with a corresponding contact pad of an integrated electronic device to be tested. Advantageously, the rod-shaped body (21) has a non uniform cross section. Moreover, a testing head and a method for obtaining the contact probe according to the invention are described.</p> |
申请公布号 |
WO2006109328(A1) |
申请公布日期 |
2006.10.19 |
申请号 |
WO2005IT00204 |
申请日期 |
2005.04.12 |
申请人 |
TECHNOPROBE S.P.A.;CRIPPA, GIUSEPPE;FELICI, STEFANO |
发明人 |
CRIPPA, GIUSEPPE;FELICI, STEFANO |
分类号 |
G01R1/067;G01R1/073 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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