发明名称 |
Test Output Compaction with Improved Blocking of Unknown Values |
摘要 |
A test output compaction arrangement and a method of generating control patterns for unknown blocking is herein disclosed. The specified bits in the control patterns, which when using linear feedback shift register (LFSR) reseeding determines control data volume and LFSR size, are preferably organized in a manner so as to balance the number of specified bits in the control patterns across test patterns.
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申请公布号 |
US2006236186(A1) |
申请公布日期 |
2006.10.19 |
申请号 |
US20060276771 |
申请日期 |
2006.03.14 |
申请人 |
NEC LABORATORIES AMERICA, INC. |
发明人 |
WANG SEONGMOON;BALAKRISHNAN KEDARNATH J.;CHAKRADHAR SRIMAT T. |
分类号 |
G01R31/28;G06F11/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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